Measuring Correlated Atomic Motion Using X-ray Diffraction

Journal of Physical Chemistry A

Volumn 103, Issue 7, 1999, Pages 921-924

  Jeong, Il Kyoung ^a   Proffen, Thomas ^a   Mohiuddin Jacobs, Farida ^a   Billinge, Simon J L ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001718733     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9836978     Document Type: Article

References (13)

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