AFM cross-sectional imaging of perpendicularly oriented nanocylinder structures of microphase-separated block copolymer films by crystal-like cleavage

Macromolecules

Volumn 40, Issue 12, 2007, Pages 4106-4108

  Komura, Motonori ^a   Iyoda, Tomokazu ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; IMAGING TECHNIQUES; PHASE SEPARATION; SCANNING PROBE MICROSCOPY; SILICON WAFERS;

CLEAVING FILMS; MULTI MODE SCANNING PROBE MICROSCOPE; SILICON SUBSTRATE;

POLYMER FILMS;

EID: 34347382000     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma0704008     Document Type: Article

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