메뉴 건너뛰기




Volumn 42, Issue 7, 2007, Pages 1555-1562

A 120-dB dynamic range CMOS image sensor with programmable power responsivity

Author keywords

CMOS active pixel; Digital cameras; Dynamic range; Image sensor; Pixel architecture; Video camera

Indexed keywords

CMOS ACTIVE PIXELS; PIXEL ARCHITECTURE; USER PROGRAMMABLE POWER RESPONSIVITY CURVES;

EID: 34347262021     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2007.899089     Document Type: Conference Paper
Times cited : (27)

References (23)
  • 2
    • 0032317768 scopus 로고    scopus 로고
    • A 256×256 CMOS imaging array with wide dynamic range pixels and columnparallel digital output
    • Dec
    • S. Decker, R. D. McGrath, K. Brehmer, and C. G. Sodini, "A 256×256 CMOS imaging array with wide dynamic range pixels and columnparallel digital output," IEEE J. Solid-State Circuits, vol. 33, no. 12, pp. 2081-2091, Dec. 1998.
    • (1998) IEEE J. Solid-State Circuits , vol.33 , Issue.12 , pp. 2081-2091
    • Decker, S.1    McGrath, R.D.2    Brehmer, K.3    Sodini, C.G.4
  • 3
    • 0035309921 scopus 로고    scopus 로고
    • A self-calibrating single-chip CMOS camera with logarithmics response
    • Apr
    • M. Loose, K. Meier, and J. Schemmel, "A self-calibrating single-chip CMOS camera with logarithmics response," IEEE J. Solid-State Circuits, vol. 36, no. 4, pp. 586-596, Apr. 2001.
    • (2001) IEEE J. Solid-State Circuits , vol.36 , Issue.4 , pp. 586-596
    • Loose, M.1    Meier, K.2    Schemmel, J.3
  • 5
    • 0031246971 scopus 로고    scopus 로고
    • Random adressable 2048 × 2048 active pixel image sensor
    • Oct
    • D. Scheffer, B. Dierickx, and G. Meynants, "Random adressable 2048 × 2048 active pixel image sensor," IEEE Trans. Electron Devices, vol. 44, no. 10, pp. 1716-1720, Oct. 1997.
    • (1997) IEEE Trans. Electron Devices , vol.44 , Issue.10 , pp. 1716-1720
    • Scheffer, D.1    Dierickx, B.2    Meynants, G.3
  • 6
    • 0031249045 scopus 로고    scopus 로고
    • Wide intrascene dynamic range CMOS APS using dual sampling
    • Oct
    • O. Yadid-Pecht and E. Possum, "Wide intrascene dynamic range CMOS APS using dual sampling," IEEE Trans. Electron Devices, vol. 44, no. 10, pp. 1721-1723, Oct. 1997.
    • (1997) IEEE Trans. Electron Devices , vol.44 , Issue.10 , pp. 1721-1723
    • Yadid-Pecht, O.1    Possum, E.2
  • 7
    • 0033280147 scopus 로고    scopus 로고
    • A 640×512 CMOS image sensor with ultrawide dynamic range floating-point pixel level ADC
    • Dec
    • D. X. D. Yang, A. E. Gamal, B. Fowler, and H. Tian, "A 640×512 CMOS image sensor with ultrawide dynamic range floating-point pixel level ADC," IEEE J. Solid-State Circuits, vol. 34, no. 12, pp. 1821-1834, Dec. 1999.
    • (1999) IEEE J. Solid-State Circuits , vol.34 , Issue.12 , pp. 1821-1834
    • Yang, D.X.D.1    Gamal, A.E.2    Fowler, B.3    Tian, H.4
  • 8
    • 0036642280 scopus 로고    scopus 로고
    • A 1K× 1K high dynamic range CMOS image sensor with on-chip programmable region-of-interest readout
    • Jul
    • O. Schrey, J. Huppertz, G. Filimonovic, A. Buβmann, W. Brockherde, and B. J. Hosticka, "A 1K× 1K high dynamic range CMOS image sensor with on-chip programmable region-of-interest readout," IEEE J. Solid-State Circuits, vol. 37, no. 7, pp. 911-915, Jul. 2002.
    • (2002) IEEE J. Solid-State Circuits , vol.37 , Issue.7 , pp. 911-915
    • Schrey, O.1    Huppertz, J.2    Filimonovic, G.3    Buβmann, A.4    Brockherde, W.5    Hosticka, B.J.6
  • 9
    • 29044445220 scopus 로고    scopus 로고
    • A wide dynamic range CMOS image sensor with multiple exposure-time signal outputs and 12-bit column-parallel cyclic A/D converters
    • Dec
    • M. Mase, S. Kawahito, M. Sasaki, Y. Wakamori, and M. Furuta, "A wide dynamic range CMOS image sensor with multiple exposure-time signal outputs and 12-bit column-parallel cyclic A/D converters," IEEE J. Solid-State Circuits, vol. 40, no. 12, pp. 2787-2795, Dec. 2005.
    • (2005) IEEE J. Solid-State Circuits , vol.40 , Issue.12 , pp. 2787-2795
    • Mase, M.1    Kawahito, S.2    Sasaki, M.3    Wakamori, Y.4    Furuta, M.5
  • 10
    • 0037246519 scopus 로고    scopus 로고
    • Adaptive-integration-time image sensor with real-time reconstruction function
    • Jan
    • T. Yasuda, T. Hamamoto, and K. Aizawa, "Adaptive-integration-time image sensor with real-time reconstruction function," IEEE Trans. Electron Devices, vol. 50, no. 1, pp. 111-120, Jan. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , Issue.1 , pp. 111-120
    • Yasuda, T.1    Hamamoto, T.2    Aizawa, K.3
  • 11
    • 27944455258 scopus 로고    scopus 로고
    • A flexible scheme for adaptive integration time control
    • Oct
    • A. Breidenassel, K. Meier, and J. Schemmel, "A flexible scheme for adaptive integration time control," in Proc. Sensors, Oct. 2004, vol. 1, pp. 280-283.
    • (2004) Proc. Sensors , vol.1 , pp. 280-283
    • Breidenassel, A.1    Meier, K.2    Schemmel, J.3
  • 13
    • 0037253140 scopus 로고    scopus 로고
    • CMOS image sensor with NMOS-only global shutter and enhanced responsiviy
    • Jan
    • M. Wany and G. P. Israel, "CMOS image sensor with NMOS-only global shutter and enhanced responsiviy," IEEE Trans. Electron Devices, vol. 50, no. 1, pp. 57-62, Jan. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , Issue.1 , pp. 57-62
    • Wany, M.1    Israel, G.P.2
  • 14
    • 0029697337 scopus 로고    scopus 로고
    • A sorting image sensor: An example of massively parallel intensity-to-time processing for low-latency computational sensors
    • Apr
    • V. Brajovic and T. Kanade, "A sorting image sensor: An example of massively parallel intensity-to-time processing for low-latency computational sensors," in Proc. 1996 IEEE Int. Conf. Robotics and Automation, Apr. 1996, pp. 1638-1643.
    • (1996) Proc. 1996 IEEE Int. Conf. Robotics and Automation , pp. 1638-1643
    • Brajovic, V.1    Kanade, T.2
  • 16
    • 8844248596 scopus 로고    scopus 로고
    • Quantitative study of high dynamic range image sensor architectures
    • Apr
    • S. Kavusi and A. E. Gamal, "Quantitative study of high dynamic range image sensor architectures," Proc. SPIE, vol. 5301, pp. 264-275, Apr. 2004.
    • (2004) Proc. SPIE , vol.5301 , pp. 264-275
    • Kavusi, S.1    Gamal, A.E.2
  • 19
    • 0029345927 scopus 로고
    • Partial positive feedback for gain enhancement of low-power CMOS OTAs
    • Jul
    • R. Wang and R. Harjani, "Partial positive feedback for gain enhancement of low-power CMOS OTAs," Analog Integr. Circuits Signal Process., vol. 8, pp. 21-35, Jul. 1995.
    • (1995) Analog Integr. Circuits Signal Process , vol.8 , pp. 21-35
    • Wang, R.1    Harjani, R.2
  • 20
    • 0035111662 scopus 로고    scopus 로고
    • Analysis of temporal noise in CMOS photodiode active pixel sensor
    • Jan
    • H. Tian, B. Fowler, and A. E. Gamal, "Analysis of temporal noise in CMOS photodiode active pixel sensor," IEEE J. Solid-State Circuits, vol. 36, no. 1, pp. 92-101, Jan. 2001.
    • (2001) IEEE J. Solid-State Circuits , vol.36 , Issue.1 , pp. 92-101
    • Tian, H.1    Fowler, B.2    Gamal, A.E.3
  • 22
    • 0037251036 scopus 로고    scopus 로고
    • A digital vision chip specialized for high-speed target tracking
    • Jan
    • T. Komuro, I. Ishii, M. Ishikawa, and A. Yoshida, "A digital vision chip specialized for high-speed target tracking," IEEE Trans. Electron Devices, vol. 50, no. 1, pp. 191-199, Jan. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , Issue.1 , pp. 191-199
    • Komuro, T.1    Ishii, I.2    Ishikawa, M.3    Yoshida, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.