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Volumn 111, Issue 22, 2007, Pages 7963-7970

Probing surface oxidation of reduced uranium dioxide thin film using synchrotron radiation

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION MECHANISM; FLUORITE STRUCTURE; PHOTOELECTRON ESCAPE DEPTH; PHOTON ENERGY;

EID: 34250747006     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp068828g     Document Type: Article
Times cited : (30)

References (53)
  • 16
    • 34250712595 scopus 로고    scopus 로고
    • Department of Physics the Chinese University of Hong Kong, accessed Jan 2001
    • Department of Physics the Chinese University of Hong Kong. http://sun.phy.cuhk.edu.hk/~surface/XPSPEAK/XPSPEAKusersguide.doc (accessed Jan 2001).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.