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Journal of Nuclear Materials

Volumn 294, Issue 1-2, 2001, Pages 168-174

X-ray photoelectron spectroscopy on uranium oxides: A comparison between bulk and thin layers

(5) Van Den Berghe, S a Miserque, F b Gouder, T b Gaudreau, B c Verwerft, M a

a BELGIAN NUCLEAR RESEARCH CENTRE (Belgium)

b JOINT RESEARCH CENTRE (Italy)

c UNIVERSITY OF LIMOGES (France)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; FISSION PRODUCTS; SPUTTER DEPOSITION; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

CODEPOSITION;

URANIUM DIOXIDE;

EID: 0035309790 PISSN: 00223115 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3115(01)00461-5 Document Type: Conference Paper

Times cited : (45)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.