Near-surface channel impedance measurements, open-circuit impedance spectra, and differential capacitance vs potential measurements of the fermi level position at Si/CH3CN contacts

Journal of Physical Chemistry C

Volumn 111, Issue 22, 2007, Pages 8120-8127

  Gstrein, Florian ^a   Michalak, David J ^a   Knapp, David W ^a   Lewis, Nathan S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER HEIGHT; CIRCUIT IMPEDANCE SPECTRA; CONTACTING PHASE; LIQUID CONTACTS;

CAPACITANCE; ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; ELECTRODES; ELECTRONS; SILICON;

FERMI LEVEL;

EID: 34250745977     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp066226r     Document Type: Article

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