Improving a 3 data-source diagnostic method

4th International IEEE North-East Workshop on Circuits and Systems, NEWCAS 2006 - Conference Proceedings

Volumn , Issue , 2006, Pages 149-152

  Hariri, Y ^a   Thibeault, C ^a  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; FAULT DETECTION; FLIP FLOP CIRCUITS; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; LOGIC PROGRAMMING;

DATA SOURCES; LOGICAL FAULTS; PRIMARY OUTPUTS; SCAN FLIP FLOPS;

DATA STRUCTURES;

EID: 34250709539     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NEWCAS.2006.250899     Document Type: Conference Paper

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