IC failure analysis tools and techniques - magic, mystery, and science

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 935-

  Soden, Jerry M ^a   Anderson, Richard E ^a   Henderson, Christopher L ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; ELECTRIC FAULT CURRENTS; ELECTRIC VARIABLES MEASUREMENT; FAILURE ANALYSIS; INFRARED IMAGING; REAL TIME SYSTEMS; SCANNING ELECTRON MICROSCOPY;

DEFECT BEHAVIOR; SOFTWARE FAULT ISOLATION;

INTEGRATED CIRCUIT TESTING;

EID: 0030395003     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)