-
4
-
-
34250686838
-
Transient Variations in Emerging SOI Technologies: Modeling and Impact on Analog/Mixed-Signal Circuits
-
ISCAS
-
Fulde, M., Schmitt-Landsiedel, D., and Knoblinger, G.: Transient Variations in Emerging SOI Technologies: Modeling and Impact on Analog/Mixed-Signal Circuits, in: Proceedings of the IEEE International Symposium on Circuits and Systems, ISCAS, 2007.
-
(2007)
Proceedings of the IEEE International Symposium on Circuits and Systems
-
-
Fulde, M.1
Schmitt-Landsiedel, D.2
Knoblinger, G.3
-
5
-
-
34250680414
-
Stochastic Matching Properties of FinFETs
-
Gustin, C., Mercha, A., Loo, J., Subramanian, V., Parvais, B., Dehan, M., and Decoutere, S.: Stochastic Matching Properties of FinFETs, IEEE Electron Device Letters, 27, 846-848, 2006.
-
(2006)
IEEE Electron Device Letters
, vol.27
, pp. 846-848
-
-
Gustin, C.1
Mercha, A.2
Loo, J.3
Subramanian, V.4
Parvais, B.5
Dehan, M.6
Decoutere, S.7
-
6
-
-
0029701860
-
-
Kinget, P. and Steyaert, M.: Impact of transistor mismatch on the speed-accuracy-power trade-off of analog CMOS circuits, in: Proceedings of the IEEE Custom Integrated Circuits Conference, CICC 1996, 333-336, 1996.
-
Kinget, P. and Steyaert, M.: Impact of transistor mismatch on the speed-accuracy-power trade-off of analog CMOS circuits, in: Proceedings of the IEEE Custom Integrated Circuits Conference, CICC 1996, 333-336, 1996.
-
-
-
-
7
-
-
33744760140
-
Design and evaluation of basic analog circuits in an emerging MuGFET technology
-
Knoblinger, G., Kuttner, F., Marshall, A., Russ, C., Haibach, P., Patruno, P., Schulz, T., Xiong, W., Gostkowski, M., Schruefer, K., and Cleavelin, C.: Design and evaluation of basic analog circuits in an emerging MuGFET technology, in: Proceedings of the IEEE International SOI Conference, 39-40, 2005.
-
(2005)
Proceedings of the IEEE International SOI Conference
, pp. 39-40
-
-
Knoblinger, G.1
Kuttner, F.2
Marshall, A.3
Russ, C.4
Haibach, P.5
Patruno, P.6
Schulz, T.7
Xiong, W.8
Gostkowski, M.9
Schruefer, K.10
Cleavelin, C.11
-
9
-
-
39549102528
-
Circuit design issues in multi-gate FET CMOS technologies
-
Digest of Technical Papers, 1656-1665
-
Pacha, C., von Arnim, K., Schulz, T., Xiong, W., Gostkowski, M., Knoblinger, G., Marshall, A., Nirschl, T., Berthold, J., Russ, C., Gossner, H., Duvvury, C., Patruno, P., Cleavelin, R., and Schruefer, K.: Circuit design issues in multi-gate FET CMOS technologies, in: IEEE International Solid-State Circuits Conference, Digest of Technical Papers, 1656-1665, 2006.
-
(2006)
IEEE International Solid-State Circuits Conference
-
-
Pacha, C.1
von Arnim, K.2
Schulz, T.3
Xiong, W.4
Gostkowski, M.5
Knoblinger, G.6
Marshall, A.7
Nirschl, T.8
Berthold, J.9
Russ, C.10
Gossner, H.11
Duvvury, C.12
Patruno, P.13
Cleavelin, R.14
Schruefer, K.15
-
10
-
-
37649030925
-
Suitability of FinFET technology for low-power mixed-signal applications
-
Parvais, B., Gustin, C., de Heyn, V., Loo, J., Dehan, M., Subramanian, V., Mercha, A., Collaert, N., Rooyackers, R., Jurczak, M., Wambacq, P., and Decoutere, S.: Suitability of FinFET technology for low-power mixed-signal applications, in: IEEE International Conference on Integrated Circuit Design and Technology, ICICDT '06, 1-4, 2006.
-
(2006)
IEEE International Conference on Integrated Circuit Design and Technology, ICICDT '06
, pp. 1-4
-
-
Parvais, B.1
Gustin, C.2
de Heyn, V.3
Loo, J.4
Dehan, M.5
Subramanian, V.6
Mercha, A.7
Collaert, N.8
Rooyackers, R.9
Jurczak, M.10
Wambacq, P.11
Decoutere, S.12
-
11
-
-
0024754187
-
Matching properties of MOS transistors
-
Pelgrom, M., Duinmaijer, A., and Welbers, A.: Matching properties of MOS transistors, IEEE Journal of Solid-State Circuits, 24, 1433-1439, 1989.
-
(1989)
IEEE Journal of Solid-State Circuits
, vol.24
, pp. 1433-1439
-
-
Pelgrom, M.1
Duinmaijer, A.2
Welbers, A.3
-
12
-
-
20444441991
-
Review on high-k dielectrics reliability issues, Device and Materials Reliability
-
Ribes, G., Mitard, J., Denais, M., Bruyere, S., Monsieur, F., Parthasarathy, C., Vincent, E., and Ghibaudo, G.: Review on high-k dielectrics reliability issues, Device and Materials Reliability, IEEE Transactions on, 5, 5-19, 2005.
-
(2005)
IEEE Transactions on
, vol.5
, pp. 5-19
-
-
Ribes, G.1
Mitard, J.2
Denais, M.3
Bruyere, S.4
Monsieur, F.5
Parthasarathy, C.6
Vincent, E.7
Ghibaudo, G.8
-
13
-
-
33744719366
-
Fin thickness asymmetry effects in multiple-gate SOI FETs (MuGFETs)
-
Schulz, T., Xiong, W., Cleavelin, C., Schruefer, K., Gostkowski, M., Matthews, K., Gebara, G., Zaman, R., Patruno, P., Chaudhry, A., Woo, A., and Colinge, J.: Fin thickness asymmetry effects in multiple-gate SOI FETs (MuGFETs), in: Proceedings of the IEEE International SOI Conference, 154-156, 2005.
-
(2005)
Proceedings of the IEEE International SOI Conference
, pp. 154-156
-
-
Schulz, T.1
Xiong, W.2
Cleavelin, C.3
Schruefer, K.4
Gostkowski, M.5
Matthews, K.6
Gebara, G.7
Zaman, R.8
Patruno, P.9
Chaudhry, A.10
Woo, A.11
Colinge, J.12
-
14
-
-
0028384568
-
Characterization, modeling, and minimization of transient thresholdvoltage shifts in MOSFETs
-
Tewksbury, T.L., I. and Lee, H.-S.: Characterization, modeling, and minimization of transient thresholdvoltage shifts in MOSFETs, IEEE Journal of Solid-State Circuits, 29, 239-252, 1994.
-
(1994)
IEEE Journal of Solid-State Circuits
, vol.29
, pp. 239-252
-
-
Tewksbury, T.L.I.1
Lee, H.-S.2
-
15
-
-
0035274597
-
A 10-bit 1-GSample/s Nyquist current-steering CMOS D/A converter
-
van den Bosch, A., Borremans, M., Steyaert, M., and Sansen, W.: A 10-bit 1-GSample/s Nyquist current-steering CMOS D/A converter, IEEE Journal of Solid-State Circuits, 36, 315-324, 2001.
-
(2001)
IEEE Journal of Solid-State Circuits
, vol.36
, pp. 315-324
-
-
van den Bosch, A.1
Borremans, M.2
Steyaert, M.3
Sansen, W.4
|