Quantifying resistivity using scanning impedance imaging

Sensors and Actuators, A: Physical

Volumn 137, Issue 2, 2007, Pages 338-344

  Buss, Brian G ^a   Evans, Daniel N ^a   Liu, Hongze ^a   Shang, Tao ^a   Oliphant, Travis E ^a   Schultz, Stephen M ^a   Hawkins, Aaron R ^a  

^a Brigham Young University   (United States)

Author keywords

Conductivity; Impedance imaging; Noncontact measurement; Resistivity

Indexed keywords

COMPUTER SIMULATION; ELECTRIC IMPEDANCE; IMAGE PROCESSING; IMAGING SYSTEMS;

IMPEDANCE IMAGING; NONCONTACT MEASUREMENT;

ELECTRIC RESISTANCE;

EID: 34250166851     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2007.03.005     Document Type: Article

References (14)

1. Grant F.C. Localization of brain tumours by determination of the electrical resistance of the growth. J. Am. Med. Assoc. 81 (1923) 2166-2169
2. Cherepenin V.A., Karpov A.Y., Korjenevsky A.V., Komienko V.N., Kultiasov Y.S., Ochapkin M.B., Trochanova O.V., and Meister J.D. Three-dimensional EIT imaging of breast tissues: system design and clinical testing. IEEE Trans. Med. Imaging 21 (2002) 662-667
3. Holder D.S., Hanquan Y., and Rao A. Some practical biological phantoms for calibrating multifrequency electrical impedance tomography. Physiol. Meas. 17 (1996) A167-A177
4. Saulnier G.J., Blue R.S., Newell J.C., Isaacson D., and Edic P.M. Electrical impedance tomography. IEEE Sig. Proc. Mag. 18 (2001) 31-43
5. De Wolf P., Snauwaert J., Hellemans L., Clarysse T., Vandervorst W., D'Olieslaeger M., and Quaeyhaegens D. Lateral and vertical dopant profiling in semiconductors by atomic force microscopy using conductive tips. J. Vac. Sci. Technol. A 13 (1995) 1699-1704
6. Kelley T.W., Granstrom E.L., and Frisbie C.D. Conducting probe atomic force microscopy: a characterization tool for molecular electronics. Adv. Mater. 11 (1999) 261-264
7. Bietsch A., Schneider M.A., Welland M.E., and Michel B. Electrical testing of gold nanostructures by conducting atomic force microscopy. J. Vac. Sci. Technol. B 18 (2000) 1160-1170
8. Shao R., Kalinin S.V., and Bonnell D.A. Local impedance imaging and spectroscopy of polycrystalline ZnO using contact atomic force microscopy. Appl. Phys. Lett. 82 (2003) 1869-1871
9. Hawkins A.R., Liu H., Oliphant T.E., and Schultz S.M. Noncontact scanning impedance imaging in an aqueous solution. Appl. Phys. Lett. 85 (2004) 1080-1082
10. Green B.C., Shang T., Morine J.C., Liu H., Schultz S.M., Oliphant T.E., and Hawkins A.R. Resolution scaling in noncontact scanning impedance imaging. Rev. Sci. Instr. 75 (2004) 4610-4614
11. Oliphant T.E., Liu H., Hawkins A.R., and Schultz S.M. Simple linear models of scanning impedance imaging for fast reconstruction of relative conductivity of biological samples. IEEE Trans. Biomed. Imaging 53 (2006) 2323-2332
12. Liu H., Hawkins A.R., Schultz S.M., and Oliphant T.E. Verification and application of a finite-difference model for quasi-electrostatic scanning impedance imaging. J. Electrostat. 65 (2007) 244-250
13. LaBianca N., and Delorme J. High Aspect Ratio Resist for Thick Film Applications (1995), Advances in Resist Technology and Processing XII, Santa Clara CA USA pp. 846-852
14. Jiguet S., Bertsch A., Hofmann H., and Renaud P. Conductive SU8 photoresist for microfabrication. Adv. Funct. Mater. 15 (2005) 1511-1516