Resolution scaling in noncontact scanning impedance imaging

Review of Scientific Instruments

Volumn 75, Issue 11, 2004, Pages 4610-4614

  Green, Benjamin C ^a   Shang, Tao ^a   Morine, Jacey C ^a   Liu, Hongze ^a   Schultz, Stephen M ^a   Oliphant, Travis E ^a   Hawkins, Aaron R ^a  

^a Brigham Young University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTANCE; ELECTRICAL IMPEDANCE TOMOGRAPHY; IMAGE BLURRING; SCANNING IMPEDANCE IMAGING (SII);

DIAGNOSIS; ELECTRIC ADMITTANCE; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; NONDESTRUCTIVE EXAMINATION; OPTICAL RESOLVING POWER; SCANNING; TISSUE;

IMAGING SYSTEMS;

EID: 10844266404     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1808127     Document Type: Article

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