A comprehensive tool for modeling CMOS image-sensor-noise performance

IEEE Transactions on Electron Devices

Volumn 54, Issue 6, 2007, Pages 1321-1329

  Gow, Ryan D ^a,b,c   Renshaw, David ^a   Findlater, Keith ^b,d   Grant, Lindsay ^b   McLeod, Stuart J ^b   Hart, John ^b   Nicol, Robert L ^b  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b STMICROELECTRONICS   (Italy)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d Gigle Semiconductor   (United Kingdom)

Author keywords

Image sensors; Modeling; Noise; Simulation

Indexed keywords

COMPUTER SIMULATION; IMAGE QUALITY; IMAGE SENSORS; MATLAB; SPURIOUS SIGNAL NOISE;

CMOS IMAGE SENSOR; IMAGE NOISE;

CMOS INTEGRATED CIRCUITS;

EID: 34249944452     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.896718     Document Type: Article

References (36)

1. J. Farrell, F. Xiao, P. Catrysse, and B. Wandell, "A simulation tool for evaluating digital camera image quality," Proc. SPIE, vol. 5294, pp. 124-131, Dec. 2004.
2. H. Wach and E. Dowski, "Noise modeling for design and simulation of computational imaging systems," in Proc Color Imag. Conf.: Color Sci., Syst., and Appl., Final Program and Proc. IS and T and SID, 2004, pp. 211-216.
3. T. Kolehmainen J. Aikio, M. Karppinen, A. Mattila, J. Makinen, K. Kataja, K. Tukkiniemi, and P. Karioja, "Simulation of imaging system's performance," Proc. SPIE, vol. 5178 pp. 204-212, Jan. 2004.
4. R. Costantini and S. Süsstrunk, "Virtual sensor design," Proc. SPIE, vol. 5301 pp. 408-419, Jun. 2004.
5. A. Theuwissen, "The effect of shrinking pixels in existing CMOS technologies," in Proc. Fraunhofer IMS Workshop CMOS Imag., 2002, pp. 14-30.
6. L. Grant, "Characterisation of noise sources in CMOS image sensors," presented at the IEEE Solid-State Circuits Conf. Image Sensor Design Forum, San Francisco CA, Feb. 2005.
7. R. Henderson and J. Hurwitz, "CMOS image sensor design," presented at the IEEE Custom Integrated Circuits Conf. Workshop, San Diego, CA, May 2001.
8. K. Findlater, R. Henderson, D. Baxter, J. E. D. Hurwitz, L. Grant, Y. Cazaux, F. Roy, D. Herault, and Y. Marcellier, "SXGA pinned photodiode CMOS image sensor in 0.35 μm technology," in Proc. IEEE Int. Solid-State Circuits Conf., Feb. 2003, vol. XLVI, pp. 218-219.
9. Wikipedia Encyclopaedia, Ray Tracing, Aug. 2005. [Online] Available: http://en.wikipedia.org/wiki/Ray_tracing
10. B. Bayer, "Color imaging array," US Patent 3 971 065, Jul. 20, 1976.
11. A. Theuwissen, Solid State Imaging With Charge Coupled Devices. Boston, MA: Kluwer, 1995.
12. S. D. Poisson, "Recherches sur la probabilité des jugements en matière criminelle et en matière civile," in Précédées des Regles Générales du Calcul des Probabilités. Paris, France: Bachelier Imprimeur-Libraire pour les Mathematiques, 1837.
13. W. Mendenhall and T. Sincich, Statistics for Engineering and the Sciences, 4th ed. New York: Macmillan, 1994.
14. H. Rhodes, G. Agranov, C. Hong, U. Boettiger, R. Mauritzson, R. J. Ladd, I. Karasev, J. McKee, E. Jenkins, W. Quuinlin, I. Patrick, J. Li, X. Fan, R. Panicacci, S. Smith, C. Mouli, and J. Bruce, "CMOS imager technology shrinks and image performance," in Proc. IEEE Workshop Microelectron. and Electron Devices, 2004, pp. 7-18.
15. M. Furumiya, H. Ohkubo, Y. Muramatsu, S. Kurosawa, F. Okamoto, Y. Fujimoto, and Y. Nakashiba, "High-sensitivity and no-crosstalk pixel technology for embedded CMOS image sensor," IEEE Trans. Electron Devices, vol. 48, no. 10, pp. 2221-2227, Oct. 2001.
16. R. W. G. Hunt, The Reproduction of Colour, 5th ed. Tolworth, U.K.: Fountain Press, 1995.
17. J. Adams, K. Parulski, and K. Spaulding, "Colour processing in digital cameras," IEEE Micro, vol 18, no. 6, pp. 20-30, Nov./Dec. 1998.
18. M. Mancuso, "White balancing," presented at the IEEE Solid State Circuits Conf. Image Sensor Design Forum, San Francisco, CA, Feb. 2006.
19. Kodak Image Sensor Solutions, CCD Image Sensor Noise Sources, Jan. 10, 2005. Application Note, Revision 2.1.
20. J. Janesick, Scientific Charge-Coupled Devices. Bellingham WA: SPIE Press, 2001.
21. H. L. Peek, D. W. E. Verbugt, and H. Heijns, "A low dark current double membrane poly-Si FT-technology for 2/3 inch 6 M pixel CCD imagers," in IEDM Tech. Dig., Dec. 5-8, 1999, pp. 871-874.
22. D. Sackett, "CMOS pixel device physics," presented at the IEEE Solid State Circuits Conf. Image Sensor Design Forum, San Francisco, CA, Feb. 2005.
23. A. W. F. Edwards, Likelihood: An Account of the Statistical Concept of Likelihood and Its Application to Scientic Inference. Baltimore, MD: The Johns Hopkins Univ. Press, 1992.
24. R. Royall, Statistical Evidence: A Likelihood Paradigm. London, U.K.: Chapman & Hall, 1997.
25. N. Balakrishnan, Handbook of the Logistic Distribution. New York: Marcel Dekker, 1992.
26. E. Weisstein, Inverse Gaussian Distribution, Oct. 2005. [Online]. Available: http://mathworld.wolfram.com/InverseGaussianDistribution.html
27. E. L. Crow and K. Shimizu, Lognormal Distributions: Theory and Applications. New York: Marcel Dekker, 1988.
28. C. Leyris, A. Hoffmann, M. Valenza, J.-C. Vildeuil, and F. Roy, "Trap competition inducing R.T.S. noise in saturation range in N-MOSFET," Proc. SPIE, vol. 5844, pp. 41-51, May 2005.
29. J. Scofield, N. Borland, and D. Fleetwood, "Random telegraph signals in small gate area PMOS transistors," in Proc. Amer. Inst. Phys. Conf. 1993. vol. 285, pp. 386-389.
30. L. K. J. Vandamme and G. Trefan, "Low frequency noise (1/f and RTS) in sub-micron MOSFETs" presented at the Semiconductor Advances Future Electronics (SAFE), Veldhoven, The Netherlands, 2001.
31. J. S. Kolhatkar, C. Salm, and H. Wallinga, "Separation of random telegraph signals from 1/f noise in MOSFETs under constant and switched bias conditions," in Proc. 33rd IEEE Conf. Eur. Solid-State Device Res., 2003, pp. 549-552.
32. T. Antal, M. Droz, G. Gyorgyi, and Z. Racz, "1/f noise and extreme value statistics," Phys. Rev. Lett., vol. 87, no. 24, pp. 240 601.1-240 601.4, Dec. 10, 2001.
33. R. A. Fisher and L. H. C. Tippet, "Limiting forms of the frequency distribution of the largest or smallest member of a sample," Proc. Camb. Philos. Soc., vol. 24, pt. 2, pp. 180-190, 1928.
34. E. J. Gumbel, Statistics of Extremes. New York: Columbia Univ Press, 1958.
35. J. Beirlant, Y. Goegebeur, J. Segers, and J. Teugels, Statistics of Extremes: Theory and Applications. Hoboken, NJ: Wiley, 2004.
36. T. Sugiki, S. Ohsawa, H. Miura, M. Sasaki, N. Nakamura, I. Inoue, M. Hoshino, Y. Tomizawa, and T. Arakawa, "A 60 mW 10b CMOS image sensor with column-to-column FPN reduction," in Proc. IEEE Int. Solid-State Circuits Conf., Feb. 2000, vol. XLIII, pp. 108-109.