Excimer laser irradiation induced suppression of off-state leakage current in organic transistors

Applied Physics Letters

Volumn 90, Issue 22, 2007, Pages

  Chou, Wei Yang ^a   Lin, Shih Ting ^c   Cheng, Horng Long ^c   Tang, Fu Ching ^c   Lin, Yow Jon ^b   You, Chang Feng ^b   Wang, Yu Wu ^b  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

DRAIN CURRENT; ELECTRIC FIELD EFFECTS; ELECTRODES; EXCIMER LASERS; LASER BEAM EFFECTS; LEAKAGE CURRENTS;

EXCIMER LASER IRRADIATION; LOWER TRAP STATE DENSITY; ORGANIC TRANSISTORS; SUBTHRESHOLD SWING (SS); WORK FUNCTIONS;

THIN FILM TRANSISTORS;

EID: 34249911433     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2743925     Document Type: Article

References (14)

1. S. Pyo, H. Son, K. Y. Choi, M. H. Yib, and S. K. Hong, Appl. Phys. Lett. 86, 133508 (2005).
2. S. C. Lim, S. H. Kim, J. H. Lee, H. Y. Yu, Y. Park, D. Kim, and T. Zyung, Mater. Sci. Eng., B 121, 211 (2005).
3. F. Xue, Z. Liu, Y. Su, and K. Varahramyan, Microelectron. Eng. 83, 298 (2006).
4. Y. H. Kim, S. K. Park, D. G. Moon, W. K. Kim, and J. I. Han, Jpn. J. Appl. Phys., Part 1 43, 3605 (2004).
5. G. Wang, T. Hirasa, D. Moses, and A. J. Heeger, Synth. Met. 146, 127 (2004).
6. F. Xue, Y. Su, and K. Varahramyan, IEEE Trans. Electron Devices 52, 1982 (2005).
7. M. J. Deen, M. H. Kazemeini, Y. M. Haddara, J. Yu, G. Vamvounis, S. Holdcroft, and W. Woods, IEEE Trans. Electron Devices 51, 1892 (2004).
8. K. Nomoto, N. Hirai, N. Yoneya, N. Kawashima, M. Noda, M. Wada, and J. Kasahara, IEEE Trans. Electron Devices 52, 1519 (2005).
9. K. M. Chang, Y. H. Chung, and G. M. Lin, IEEE Electron Device Lett. 23, 255 (2002).
10. A. A. Orouji and M. J. Kumar, IEEE Trans. Electron. Device Mater. Rel. 5, 675 (2005).
11. M. S. Shieh, Y. J. Lin, C. M. Yu, and T. F. Lei, Nucl. Instrum. Methods Phys. Res. B 237, 223 (2005).
12. L. Sun, D. Y. Li, S. D. Zhang, X. Y. Liu, Y. Wang, and R. Q. Han, Semicond. Sci. Technol. 21, 608 (2006).
13. Y. J. Lin, W. Y. Chou, S. T. Lin, and Y. M. Chen, Jpn. J. Appl. Phys., Part 1 44, 1218 (2005).
14. A. R. Völkel, R. A. Street, and D. Knipp, Phys. Rev. B 66, 195336 (2002).