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Volumn 260, Issue 1, 2007, Pages 304-308
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Investigation of radiation damage in a Si PIN photodiode for particle detection
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Author keywords
Charge collection efficiency; IBIC; Microbeam; Radiation hardness; Si PIN photodiode
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Indexed keywords
CHARGE DENSITY;
ELECTRIC FIELD EFFECTS;
FULL WIDTH AT HALF MAXIMUM;
PROTON BEAMS;
PROTON IRRADIATION;
RADIATION DAMAGE;
CHARGE COLLECTION EFFICIENCY;
RADIATION HARDNESS;
REVERSE BIAS;
PHOTODIODES;
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EID: 34249903856
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2007.02.038 Document Type: Article |
Times cited : (19)
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References (14)
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