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Volumn 260, Issue 1, 2007, Pages 304-308

Investigation of radiation damage in a Si PIN photodiode for particle detection

Author keywords

Charge collection efficiency; IBIC; Microbeam; Radiation hardness; Si PIN photodiode

Indexed keywords

CHARGE DENSITY; ELECTRIC FIELD EFFECTS; FULL WIDTH AT HALF MAXIMUM; PROTON BEAMS; PROTON IRRADIATION; RADIATION DAMAGE;

EID: 34249903856     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.02.038     Document Type: Article
Times cited : (19)

References (14)
  • 13
    • 34249905677 scopus 로고    scopus 로고
    • www.srim.org.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.