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Volumn 231, Issue 1-4, 2005, Pages 507-512
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Investigation of charge collection in a silicon PIN photodiode
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Author keywords
Charge collection efficiency; Electronic properties; Ion beam induced charge; Microbeam; Si photodiode
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Indexed keywords
ELECTRONIC PROPERTIES;
ION BEAMS;
PHOTODIODES;
SEMICONDUCTOR DEVICES;
CHARGE COLLECTION EFFICIENCY;
ION BEAM INDUCED CHARGE;
MICROBEAM;
SI PHOTODIODE;
SILICON;
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EID: 33644582621
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2005.01.108 Document Type: Conference Paper |
Times cited : (19)
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References (15)
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