Radiation damage microstructures in silicon and application in position sensitive charged particle detection

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 231, Issue 1-4, 2005, Pages 502-506

  Jaksic M ^a   Medunic Z ^a   Bogovac, M ^a   Skukan, N ^a  

^a RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

IBIC; Position sensitive detectors; Radiation damage; Silicon detectors

Indexed keywords

ELECTRIC CHARGE; HIGH ENERGY PHYSICS; ION BEAMS; MICROSTRUCTURE; PHOTODIODES; SILICON;

IBIC; PARTICLE DETECTION; POSITION SENSITIVE DETECTORS; SILICON DETECTORS;

RADIATION DAMAGE;

EID: 33644502884     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.01.107     Document Type: Conference Paper

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