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Volumn 129, Issue 2, 2007, Pages 416-424

Study on embedding and integration of microsensors into metal structures for manufacturing applications

Author keywords

[No Author keywords available]

Indexed keywords

CONDITION MONITORING; OPERATING COSTS; OPTIMIZATION; PROCESS CONTROL; QUALITY ASSURANCE; SILICON WAFERS; THERMOCOUPLES; ULTRASONIC WELDING;

EID: 34249878524     PISSN: 10871357     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2515456     Document Type: Article
Times cited : (40)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.