Embedding and characterization of fiber-optic and thin-film sensors in metallic structures

Sensor Review

Volumn 24, Issue 4, 2004, Pages 370-377

  Li, Xiaochun ^a   Tang, Wenliang ^b   Golnas, Anastasios ^c  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b EAST CHINA JIAOTONG UNIVERSITY   (China)

^c Advantest America Corporation   (United States)

Author keywords

Fibre optic sensors; Metals; Structures; Thin films

Indexed keywords

ELECTRODEPOSITION; HIGH TEMPERATURE EFFECTS; LAYERED MANUFACTURING; METALS; RESIDUAL STRESSES; SENSORS; STRAIN RATE; STRUCTURAL METALS; THIN FILMS;

EMBEDDED SENSORS; FIBER-OPTIC SENSORS; METAL STRUCTURES; THIN-FILM SENSORS;

FIBER OPTICS;

EID: 9444277766     PISSN: 02602288     EISSN: None     Source Type: Journal    
DOI: 10.1108/02602280410558403     Document Type: Article

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