Properties of crystalline γ-TeO2 thin film

Journal of Crystal Growth

Volumn 305, Issue 1, 2007, Pages 237-241

  Dewan, Namrata ^a   Sreenivas, K ^a   Gupta, Vinay ^a  

^a UNIVERSITY OF DELHI   (India)

Author keywords

A1. Crystal structure; A1. Post deposition annealing; A1. Sputtering; B1. Oxides

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; GAMMA RAY PRODUCTION; OPTICAL PROPERTIES; OXIDES; SPUTTERING; TELLURIUM COMPOUNDS; TEMPERATURE DISTRIBUTION; THIN FILMS;

POST-DEPOSITION ANNEALING; ULTRAVIOLET-VISIBLE (UV-VIS) TRANSMITTANCE MEASUREMENT;

CRYSTALLINE MATERIALS;

EID: 34249871893     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.03.054     Document Type: Article

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