Gamma radiation dosimetry using Tellurium dioxide thin film structures

Sensors

Volumn 2, Issue 8, 2002, Pages 347-355

  Arshak, Khalil ^a   Korostynska, Olga ^a  

^a UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

Dosimetry; Gamma Radiation; Optical Band Gap; Tellurium Dioxide; Thin Films

Indexed keywords

ABSORPTION; CHEMICAL VAPOR DEPOSITION; CRYSTAL STRUCTURE; DOSIMETRY; ELECTRIC PROPERTIES; GAMMA RAYS; IRRADIATION; OPTICAL PROPERTIES; TELLURIUM COMPOUNDS;

GAMMA RADIATION DOSIMETRY; OPTICAL BAND GAP; TELLURIUM DIOXIDE; THIN FILM STRUCTURES;

THIN FILMS;

EID: 18444414611     PISSN: 14243210     EISSN: None     Source Type: Journal    
DOI: 10.3390/s20800347     Document Type: Article

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