Sputtered stoichiometric TeO2 glass films: Dispersion of linear and nonlinear optical properties

Journal of Applied Physics

Volumn 94, Issue 3, 2003, Pages 1654-1661

  D'Amore, Franco ^a   Di Giulio, Massimo ^b   Pietralunga, Silvia M ^a   Zappettini, Andrea ^c   Nasi, Lucia ^c   Rigato, Valentine ^d   Martinelli, Mario ^a,e  

^a CORECOM ^*  (Italy)

^b UNIVERSITY OF SALENTO   (Italy)

^c IMEM CNR   (Italy)

^d LABORATORI NAZIONALI DI LEGNARO   (Italy)

^e POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTERING; STOICHIOMETRY; TELLURIUM COMPOUNDS; TRANSPARENCY; X RAY DIFFRACTION ANALYSIS;

GLASS FILMS;

OPTICAL FILMS;

EID: 0042512177     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1590060     Document Type: Article

References (33)

1. R. El-Mallawany, Mater. Chem. Phys. 58, 93 (1998).
2. R. El-Mallawany, Mater. Chem. Phys. 60, 103 (1999).
3. T. Yano, J. Fukumoto, and A. Watanabe, J. Appl. Phys. 42, 3674 (1971).
4. I. Abdulhalim, C. N. Pannel, J. Wang, G. Wylangowski, and D. N. Payne, J. Appl. Phys. 75, 519 (1994).
5. S.-H. Kim, T. Yoko, and S. Sakka, J. Am. Ceram. Soc. 76, 2486 (1993).
6. S.-H. Kim and T. Yoko, J. Am. Ceram. Soc. 78, 1061 (1995).
7. S.-H. Kim, J. Mater. Res. 14, 1074 (1999).
8. G. Ghosh, J. Am. Ceram. Soc. 78, 2828 (1999).
9. H. Nasu, J. Matsuoka, and K. Kamiya, J. Non-Cryst. Solids 178, 23 (1994).
10. J. S. Wang, E. M. Vogel, and E. Snitzer, Opt. Mater. (Amsterdam, Neth.) 3, 187 (1994).
11. E. Marhic, I. Morita, M.-C. Ho, Y. Akasaka, and L. G. Kazovsky, Electron. Lett. 35, 2045 (1999).
12. S. Q. Man, E. Y. B. Pun, and P. S. Chung, Opt. Commun. 168, 369 (1999).
13. E. Chierici, M. C. Didavide, A. Moro, O. Rossotto, L. Tallone, and E. Monchiero, Proceedings of the 2002 IEEE/LEOS Workshop on Fibre and Optical Passive Components, 2002, p. 24.
14. H. Bookey, K. Bindra, A. Kar, B. Wherrett, X. Lui, and A. Jha, Proceedings of 2002 IEEE/LEOS Workshop on Fibre and Optical Passive Components, 2002, p. 29.
15. M. Di Giulio, D. Manno, M. C. Nicotra, and M. Re, J. Non-Cryst. Solids 155, 67 (1992).
16. M. Di Giulio, M. C. Nicotra, M. Re, R. Rella, and P. Siciliano, Appl. Surf. Sci. 65/66, 313 (1993).
17. M. Di Giulio, G. Micocci, R. Rella, P. Siciliano, and A. Tepore, Phys. Status Solidi A 136, K 101 (1993).
18. L. Doolittle, Nucl. Instrum. Methods Phys. Res. B 9, 334 (1985).
19. M. Mayer, AIP Conf. Proc. 475, 541 (1999).
20. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, Amsterdam, 1992).
21. A. M. Efimov, Optical Constants of Inorganic Glasses (Chemical Rubber Corp., Boca Raton, FL, 1995).
22. F. Kajzar, in Characterization Thechnique and Tabulations for Organic Nonlinear Optical Materials, edited by M. G. Kuzyk and C. W. Dirk (Marcel Dekker, New York, 1998).
23. F. C. Blom, A. Driessen, H. J. W. M. Hoekstra, J. B. P. van School, and Th. J. A. Poma, Opt. Mater. (Amsterdam, Neth.) 12, 327 (1999).
24. P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
25. X. H. Wang, D. P. West, N. B. McKoewn, and T. A. King, J. Opt. Soc. Am. B 15, 1895 (1998).
26. K. Miyano, T. Nishiwaki, and A. Tomioka, Opt. Commun. 91, 501 (1992).
27. D. S. Bethune, J. Opt. Soc. Am. B 6, 910 (1989).
28. F. Kajzar and J. Messier, Phys. Rev. A 32, 2352 (1985).
29. R. F. Shi and A. F. Garito, in Characterization Technique and Tabulations for Organic Nonlinear Optical Materials, edited by M. G. Kuzyk and C. W. Dirk (Marcel Dekker, New York, 1998).
30. B. Buchalter and G. R. Meredith, Appl. Opt. 21, 3221 (1982).
31. V. K. Tikhomirov and S. A. Tikhomirova, J. Non-Cryst. Solids 284, 193 (2001).
32. R. W. Boyd, Nonlinear Optics (Academic, San Diego, 1992).
33. F. Charra and J. Messier, in Conjugated Materials: Opportunities in Electronics, Optoelectronics and Molecular Electronics, edited by J. L. Brédas and R. R. Chancd (Kluwer Academic, Dordrecht, 1990).