Characterization of spherical Si by photoluminescence measurement

Journal of Applied Physics

Volumn 101, Issue 10, 2007, Pages

  Nagai, Takehiko ^a   Liu, Zhengxin ^a   Masuda, Atsushi ^a   Kondo, Michio ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT MEASUREMENT; PHONONS; PHOTOCONDUCTIVITY; PHOTOLUMINESCENCE; SOLAR CELLS;

DROPPING METHODS; PHOTOCONDUCTANCE DECAY METHOD; PHOTOLUMINESCENCE MEASUREMENT; SPHERICAL SILICON;

SILICON;

EID: 34249870854     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2736944     Document Type: Article

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