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Volumn 38, Issue 4 A, 1999, Pages 1847-1851

Development of a sessile drop method concerning czochralski si crystal growth

Author keywords

Czochralski silicon crystal growth; Oxygen dissolution rate; Oxygen transportation; Sessile drop; Silica glass; Silicon melt

Indexed keywords


EID: 0009985326     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.1847     Document Type: Article
Times cited : (3)

References (13)
  • 3
    • 0003347212 scopus 로고
    • eds. H. R. Huff, R. J. Kriegler and Y. Takeshi The Electrochem. Soc., Pennington
    • K. Hoshikawa, H. Hirata, H. Nakanishi and K. Ikuta: Semiconductor Silicon, eds. H. R. Huff, R. J. Kriegler and Y. Takeshi (The Electrochem. Soc., Pennington, 1981) p. 101.
    • (1981) Semiconductor Silicon , pp. 101
    • Hoshikawa, K.1    Hirata, H.2    Nakanishi, H.3    Ikuta, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.