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Volumn 38, Issue 4 A, 1999, Pages 1847-1851
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Development of a sessile drop method concerning czochralski si crystal growth
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Author keywords
Czochralski silicon crystal growth; Oxygen dissolution rate; Oxygen transportation; Sessile drop; Silica glass; Silicon melt
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Indexed keywords
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EID: 0009985326
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.1847 Document Type: Article |
Times cited : (3)
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References (13)
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