A new approach in the study of tethered diblock copolymer surface morphology and its tethering density dependence

Polymer

Volumn 48, Issue 13, 2007, Pages 3732-3738

  Xiong, Huiming ^a   Zheng, Joseph X ^a   Van Horn, Ryan M ^a   Jeong, Kwang Un ^a   Quirk, Roderic P ^a   Lotz, Bernard ^b   Thomas, Edwin L ^c   Brittain, William J ^a   Cheng, Stephen Z D ^a  

^a University of Akron   (United States)

^b INSTITUT CHARLES SADRON   (France)

^c Massachusetts Institute of Technology   (United States)

Author keywords

Block copolymer; Single crystal; Surface morphology and chemical composition

Indexed keywords

ATOMIC FORCE MICROSCOPY; RAMAN SCATTERING; SINGLE CRYSTALS; SOLUTIONS; SURFACE MORPHOLOGY; SURFACE STRUCTURE; SYNTHESIS (CHEMICAL);

COPOLYMER BRUSHES; PHYSICAL MORPHOLOGIES; TETHERING DENSITY;

BLOCK COPOLYMERS;

BLOCK COPOLYMER; CHEMICAL COMPOSITION; CRYSTALLINITY; POLYLACTIC ACID; POLYMETHYL METHACRYLATE; POLYSTYRENE; SOLVENT;

EID: 34249783148     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2007.04.067     Document Type: Article

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