메뉴 건너뛰기




Volumn 42, Issue 6, 2007, Pages 1352-1361

A complementary switched MOSFET architecture for the 1/f noise reduction in linear analog CMOS ICs

Author keywords

1 f noise reduction; CMOS linear analog IC; Switched bias technique

Indexed keywords

CMOS INTEGRATED CIRCUITS; NOISE ABATEMENT; OPERATIONAL AMPLIFIERS; PHASE NOISE; STANDARDS;

EID: 34249778119     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2007.897144     Document Type: Article
Times cited : (20)

References (17)
  • 3
    • 0030286542 scopus 로고    scopus 로고
    • Circuit techniques for reducing the effect of op-amp imperfections: Auto-zeroing, correlated double sampling and chopper stabilization
    • Nov
    • C. C. Enz, "Circuit techniques for reducing the effect of op-amp imperfections: Auto-zeroing, correlated double sampling and chopper stabilization," Proc. IEEE, vol. 84, no. 11, pp. 1584-1614, Nov. 1996.
    • (1996) Proc. IEEE , vol.84 , Issue.11 , pp. 1584-1614
    • Enz, C.C.1
  • 4
    • 34250803723 scopus 로고
    • 1/f noise reduction of metal-oxide-semiconductor transistors by cycling from inversion to accumulation
    • I. Bloom and Y. Nemirovsky, "1/f noise reduction of metal-oxide-semiconductor transistors by cycling from inversion to accumulation," Appl. Phys. Lett., vol. 58, pp. 1664-1666, 1991.
    • (1991) Appl. Phys. Lett , vol.58 , pp. 1664-1666
    • Bloom, I.1    Nemirovsky, Y.2
  • 5
    • 0042347566 scopus 로고
    • The decrease of random telegraph signal noise in metal-oxide-semiconductor field-effect transistors when cycled from inversion to accumulation
    • B. Dierickx and E. Simoen, "The decrease of random telegraph signal noise in metal-oxide-semiconductor field-effect transistors when cycled from inversion to accumulation," J. Appl. Phys., vol. 71, pp. 2028-2029, 1992.
    • (1992) J. Appl. Phys , vol.71 , pp. 2028-2029
    • Dierickx, B.1    Simoen, E.2
  • 9
    • 33646523578 scopus 로고    scopus 로고
    • A physics-based low frequency noise model for MOSFETs under periodic large signal excitation
    • R. Brederlow, J. Koh, and R. Thewes, "A physics-based low frequency noise model for MOSFETs under periodic large signal excitation," J. Solid-State. Election., vol. 50, pp. 668-73, 2006.
    • (2006) J. Solid-State. Election , vol.50 , pp. 668-673
    • Brederlow, R.1    Koh, J.2    Thewes, R.3
  • 11
    • 0025398785 scopus 로고
    • A unified model for flicker noise in metal-oxide-semiconductor field-effect transistors
    • K. K. Hung, P. K. Ko, C. Hu, and Y. C. Cheng, "A unified model for flicker noise in metal-oxide-semiconductor field-effect transistors," IEEE Trans. Election Devices, vol. 37, pp. 654-665, 1990.
    • (1990) IEEE Trans. Election Devices , vol.37 , pp. 654-665
    • Hung, K.K.1    Ko, P.K.2    Hu, C.3    Cheng, Y.C.4
  • 12
    • 34249776870 scopus 로고    scopus 로고
    • Low-frequency noise reduction technique for linear analog CMOS IC's,
    • Ph.D. dissertation, Dept. of EEIT, Technische Universität München, Munich, Germany
    • J. Koh, "Low-frequency noise reduction technique for linear analog CMOS IC's," Ph.D. dissertation, Dept. of EEIT, Technische Universität München, Munich, Germany, 2005.
    • (2005)
    • Koh, J.1
  • 14
    • 34249803144 scopus 로고    scopus 로고
    • Low noise CMOS chopper instrumentation amplifiers for thermoelectric microsensors,
    • Ph.D. dissertation, Dept. of ITEE, ETH Zurich, Zurich, Switzerland
    • C. Ivo Menolfi, "Low noise CMOS chopper instrumentation amplifiers for thermoelectric microsensors," Ph.D. dissertation, Dept. of ITEE, ETH Zurich, Zurich, Switzerland, 2000.
    • (2000)
    • Ivo Menolfi, C.1
  • 16
    • 0035121139 scopus 로고    scopus 로고
    • Effect of switched biasing on 1/f noise and random telegraph signals in deep-submicron MOSFETs
    • A. P. van der Wel, E. A. M. Klumperink, and B. Nauta, "Effect of switched biasing on 1/f noise and random telegraph signals in deep-submicron MOSFETs," Electron. Lett., vol. 37, pp. 55-56, 2001.
    • (2001) Electron. Lett , vol.37 , pp. 55-56
    • van der Wel, A.P.1    Klumperink, E.A.M.2    Nauta, B.3
  • 17
    • 27344456459 scopus 로고    scopus 로고
    • Relating random telegraph signal noise in metal oxide semiconductor transistors to interface trap energy distribution
    • A. P. van der Wel, E. A. M. Klumperink, and B. Nauta, "Relating random telegraph signal noise in metal oxide semiconductor transistors to interface trap energy distribution," Appl. Phys. Lett., vol. 87, pp. 183507-10, 2005.
    • (2005) Appl. Phys. Lett , vol.87 , pp. 183507-183510
    • van der Wel, A.P.1    Klumperink, E.A.M.2    Nauta, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.