An investigation of nanoindentation tests on the single crystal copper thin film via an atomic force microscope and molecular dynamics simulation

Proceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science

Volumn 221, Issue 2, 2007, Pages 259-266

  Huo, Dehong ^a   Liang, Y ^b   Cheng, K ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Atomic force microscope; Mechanical properties; Molecular dynamics; Nanoindentation; Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELASTIC MODULI; HARDNESS; MOLECULAR DYNAMICS; NANOINDENTATION; PLASTIC DEFORMATION; SINGLE CRYSTALS; THIN FILMS;

EMBEDDED ATOM METHOD; OLIVER-PHARR METHOD;

COPPER;

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; COPPER; ELASTIC MODULI; HARDNESS; MOLECULAR DYNAMICS; NANOINDENTATION; PLASTIC DEFORMATION; SINGLE CRYSTALS; THIN FILMS;

EID: 34249673805     PISSN: 09544062     EISSN: None     Source Type: Journal    
DOI: 10.1243/0954406JMES448     Document Type: Article

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