메뉴 건너뛰기




Volumn 28, Issue 7, 2007, Pages 2184-2189

Numerical analysis of the influence of buffer layer thickness on the residual stresses in YBCO/La2Zr2O7/Ni superconducting materials

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; COMPRESSIVE STRESS; FINITE ELEMENT METHOD; MICROSTRUCTURAL EVOLUTION; PULSED LASER DEPOSITION; RESIDUAL STRESSES; SOL-GEL PROCESS; THERMAL EXPANSION; THERMAL STRESS;

EID: 34249324125     PISSN: 02613069     EISSN: 18734197     Source Type: Journal    
DOI: 10.1016/j.matdes.2006.07.003     Document Type: Article
Times cited : (10)

References (24)
  • 24
    • 84903357513 scopus 로고    scopus 로고
    • Ceramic Web Book, Materials Science and Engineering Laboratory, Ceramic, Z00 694, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.