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Volumn 28, Issue 7, 2007, Pages 2184-2189
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Numerical analysis of the influence of buffer layer thickness on the residual stresses in YBCO/La2Zr2O7/Ni superconducting materials
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Author keywords
[No Author keywords available]
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Indexed keywords
BUFFER LAYERS;
COMPRESSIVE STRESS;
FINITE ELEMENT METHOD;
MICROSTRUCTURAL EVOLUTION;
PULSED LASER DEPOSITION;
RESIDUAL STRESSES;
SOL-GEL PROCESS;
THERMAL EXPANSION;
THERMAL STRESS;
CLASSICAL LAMINATION THEORY;
TAPE SUBSTRATE;
SUPERCONDUCTING FILMS;
BUFFER LAYERS;
COMPRESSIVE STRESS;
FINITE ELEMENT METHOD;
MICROSTRUCTURAL EVOLUTION;
PULSED LASER DEPOSITION;
RESIDUAL STRESSES;
SOL-GEL PROCESS;
SUPERCONDUCTING FILMS;
THERMAL EXPANSION;
THERMAL STRESS;
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EID: 34249324125
PISSN: 02613069
EISSN: 18734197
Source Type: Journal
DOI: 10.1016/j.matdes.2006.07.003 Document Type: Article |
Times cited : (10)
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References (24)
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