Microstructural and electrical characterization of gas cluster ion beam-smoothed YBCO films

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 III, 2003, Pages 2470-2473

  Hatzistergos, Michael S ^a   Efstathiadis, Harry ^a   Lifshin, Eric ^a   Kaloyeros, Alain E ^a   Reeves, Jodi L ^b   Selvamanickam, Venkat ^b   Allen, Lisa P ^c   MacCrimmon, Rory ^c  

^a STATE UNIVERSITY OF NEW YORK   (United States)

^b Super Power Inc   (United States)

^c Epion Corporation   (United States)

Author keywords

Curent density; Gas cluster ion beam (GCIB); Microscopy; Superconducting films; X ray measurements.

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ENERGY DISPERSIVE SPECTROSCOPY; ETCHING; ION BEAMS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY; YTTRIUM COMPOUNDS;

FOCUSED ION BEAM (FIB) MICROSCOPY;

SEMICONDUCTING FILMS;

EID: 0041975893     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.811823     Document Type: Conference Paper

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