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Volumn 426-431, Issue II, 2005, Pages 1033-1042

Transmission electron microscopy studies of YBCO coated conductors prepared by pulsed-laser deposition and multiple-stage chemical vapor deposition processes

Author keywords

a Axis oriented grain; MOCVD YBCO; PLD YBCO; TEM; Y2O3

Indexed keywords

CERIUM COMPOUNDS; CHEMICAL VAPOR DEPOSITION; COPPER OXIDES; PULSED LASER DEPOSITION; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

EID: 25644449570     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2005.01.058     Document Type: Article
Times cited : (10)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.