Combining radial basis function neural network and genetic algorithm to improve HDD driver IC chip scale package assembly yield

Expert Systems with Applications

Volumn 34, Issue 1, 2008, Pages 588-595

  Huang, M L ^a   Hung, Y H ^a  

^a NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Assembly yield; Driver IC; GA; RBFN; Warpage

Indexed keywords

CHIP SCALE PACKAGES; GENETIC ALGORITHMS; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; PARAMETER ESTIMATION;

ASSEMBLY YIELDS; DRIVER IC; RBFN; WARPAGE;

RADIAL BASIS FUNCTION NETWORKS;

EID: 34249054107     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eswa.2006.09.030     Document Type: Article

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