High refractive index nanoparticle-loaded encapsulants for light-emitting diodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6486, Issue , 2007, Pages

  Mont, Frank W ^a   Kim, Jong Kyu ^a   Schubert, Martin F ^a   Luo, Hong ^a,b   Schubert, E Fred ^a,b   Siegel, Richard W ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b Research Rensselaer Polytechnic Institute   (United States)

Author keywords

Encapsulant; Epoxy; Graded index; Light emitting diode; Nanoparticle; Refractive index; Scattering; Titania

Indexed keywords

EPOXY RESINS; LIGHT SCATTERING; NANOPARTICLES; OPACITY; REFRACTIVE INDEX; SURFACE ACTIVE AGENTS; TITANIUM DIOXIDE;

ENCAPSULANT; GRADED INDEX; LOADING FACTOR; OPTICAL SCATTERING LENGTH;

LIGHT EMITTING DIODES;

EID: 34248652398     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.723305     Document Type: Conference Paper

References (8)

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4. Y. Xi, X. Li, J. K. Kim, F. Mont, Th. Gessmann, H. Luo, and E. F. Schubert, "Quantitative assessment of diffusivity and specularity of surface-textured reflectors for light extraction in light-emitting diodes", J. Vac. Sci. Technol. A 24, 1627 (2006).
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8. F. W. Mont, H. Luo, M. F. Schubert, J. K. Kim, E. F. Schubert, and R. W. Siegel, "Nanoparticle-loaded encapsulation materials for light-emitting diode applications", submitted to Mater. Res. Soc. Symp. Proc., 2006.