Quantitative assessment of diffusivity and specularity of surface-textured reflectors for light extraction in light-emitting diodes

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 24, Issue 4, 2006, Pages 1627-1630

  Xi, Y ^a   Li, X ^a   Kim, J K ^b   Mont, F ^b   Gessmann, Th ^b   Luo, H ^a   Schubert, E F ^a,b  

^a Rensselaer Polytechnic Institute   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSE REFLECTOR; DIFFUSIVITY; LIGHT EXTRACTION; SURFACE-TEXTURED;

DIFFUSION; ETCHING; ION BEAMS; LIGHT EMITTING DIODES; LITHOGRAPHY; WAVEGUIDES;

MIRRORS;

EID: 33745514492     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2194924     Document Type: Article

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