Structural and morphological characterizations of ZnO films grown on GaAs substrates by MOCVD

Applied Physics A: Materials Science and Processing

Volumn 88, Issue 1, 2007, Pages 83-87

  Agouram, S ^a   Zuniga Perez J ^a   Munoz Sanjose V ^a  

^a UNIVERSITY OF VALENCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

SUBSTRATE ORIENTATION; TERTIARYBUTANOL;

THIN FILMS;

EID: 34248589297     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-3970-4     Document Type: Article

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