Quantitative analysis of molecularly stacked layer structures in supported organic thin films by synchrotron grazing-incidence X-ray scattering

Journal of Applied Crystallography

Volumn 40, Issue SUPPL. 1, 2007, Pages

  Yoon, Jinhwan ^a   Choi, Seungchel ^a   Jin, Sangwoo ^a   Jin, Kyeong Sik ^a   Heo, Kyuyoung ^a   Ree, Moonhor ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Grazing incidence X ray scattering; Molecularly stacked layer structure; Orientation and distribution

Indexed keywords

EID: 34248324498     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806056056     Document Type: Conference Paper

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