A level set approach to model directed nanocrack patterns

Computational Materials Science

Volumn 39, Issue 4, 2007, Pages 849-856

  Salac, David ^a   Lu, Wei ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Level set; Nanocrack; Nanowire; Thin film

Indexed keywords

COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; CRACK TIPS; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; NANOWIRES; THIN FILMS;

CRACK EXTENSION; CRACK INTERSECTION; LEVEL SET; NANOCRACKS;

CRACK PROPAGATION;

EID: 34248188658     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.commatsci.2006.10.008     Document Type: Article

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