Controlled nanocrack patterns for nanowires

Journal of Computational and Theoretical Nanoscience

Volumn 3, Issue 2, 2006, Pages 263-268

  Salac, David ^a   Lu, Wei ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Nanocrack; Nanowires; Phase field model; Thin film

Indexed keywords

CRACK PROPAGATION; ELASTICITY; FOURIER TRANSFORMS; ITERATIVE METHODS; MATHEMATICAL MODELS; METALS; SEMICONDUCTOR MATERIALS; THIN FILMS;

CONTROLLED NANOCRACK; CRACK FRONT TRACKING; NANOWIRE;

NANOSTRUCTURED MATERIALS;

EID: 33646557344     PISSN: 15461955     EISSN: None     Source Type: Journal    
DOI: 10.1166/jctn.2006.3007     Document Type: Article

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