Examination of enamel-adhesive interface with focused ion beam and scanning electron microscopy

American Journal of Orthodontics and Dentofacial Orthopedics

Volumn 131, Issue 5, 2007, Pages 646-650

  Vilchis, Rogelio José Scougall ^a   Hotta, Yasuaki ^b   Yamamoto, Kohji ^a  

^a School of Dentistry   (Japan)

^b Central Research Institute of Oral Science   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMEDICAL AND DENTAL MATERIALS; DENTIN BONDING AGENT; PHOSPHORIC ACID; RESIN CEMENT; TRANSBOND XT; UNCLASSIFIED DRUG;

ARTICLE; DENTAL ACID ETCHING; DENTAL BONDING; DRUG EFFECT; ENAMEL; HUMAN; METHODOLOGY; ORTHODONTIC DEVICE; PREMOLAR TOOTH; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

ACID ETCHING, DENTAL; BICUSPID; DENTAL BONDING; DENTAL ENAMEL; DENTAL MATERIALS; DENTIN-BONDING AGENTS; HUMANS; MICROSCOPY, ELECTRON, SCANNING; ORTHODONTIC BRACKETS; PHOSPHORIC ACIDS; RESIN CEMENTS; SURFACE PROPERTIES;

EID: 34247624128     PISSN: 08895406     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ajodo.2006.11.017     Document Type: Article

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