Fine-grained BaZr0.2Ti0.8O3 thin films for tunable device applications

Journal of Applied Physics

Volumn 101, Issue 8, 2007, Pages

  Ying, Z ^a,b   Yun, P ^a   Zhou, X Y ^a   Song, Z T ^b   Feng, S L ^b   Wang, Y ^a   Wang, D Y ^a   Chan, H L W ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; CURIE TEMPERATURE; FERROELECTRICITY; PULSED LASER DEPOSITION; TENSILE STRESS;

CRYSTALLINITY; DIELECTRIC TUNABILITY; FERROELECTRIC STATE; TUNABLE DEVICES;

THIN FILMS;

EID: 34247587227     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2721968     Document Type: Article

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