Computer-aided crystallographic analysis in the TEM

Advances in Imaging and Electron Physics

Volumn 125, Issue , 2003, Pages

  Zaefferer, Stefan ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; OPTICAL RESOLVING POWER; TRANSMISSION ELECTRON MICROSCOPY;

COMPUTER-AIDED CALIBRATION; MAGNETIC ROTATION; SPATIAL RESOLUTION;

CRYSTALLOGRAPHY;

EID: 34247530323     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(02)80019-2     Document Type: Article

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