Scanning probe measurements on luminescent Si nanoclusters in SiO2 films

Thin Solid Films

Volumn 515, Issue 16 SPEC. ISS., 2007, Pages 6375-6380

  Mayandi, J ^a   Finstad, T G ^a   Thogersen A ^a   Foss, S ^a   Serincan, U ^b   Turan, R ^b  

^a UNIVERSITY OF OSLO   (Norway)

^b MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

Author keywords

AFM; Luminescence; Nanocluster; Nanocrystal; Si QD

Indexed keywords

ATOMIC FORCE MICROSCOPY; ION IMPLANTATION; LUMINESCENCE; NANOCLUSTERS; NANOCRYSTALS; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

SECTIONING TECHNIQUE; SI QD; SPATIAL DISTRIBUTION;

THIN FILMS;

EID: 34247504548     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.11.174     Document Type: Article

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