Enhancing commercial CAD tools toward the electrothermal simulation of power transistors

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

Volumn 2006, Issue , 2006, Pages

  De Paola, F M ^a   D'Alessandro, V ^a   Breglio, G ^a   Rinaldi, N ^a   Spirito, P ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SIMULATION; ELECTRIC POWER SYSTEMS; TRANSIENT ANALYSIS;

ELECTROTHERMAL SIMULATION; POWER MULTICELLULAR TRANSISTORS; THERMAL RUGGEDNESS; TRANSIENT CONDITIONS;

TRANSISTORS;

EID: 34247475786     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

1. S. P. Gaur, D. H. Navon, T. Teerlinck, "Transistor design and thermal stability," IEEE Trans. on Electron Devices, 20, 6, pp. 527-534, 1973.
2. S. Wünske, C. Clauß, P. Schwarz, and F. Winkler, "Electro-thermal circuit simulation using simulator coupling," IEEE Trans. on VLSI Systems, 5, 3, pp. 277-282, 1997.
3. M. Latif and P. R. Bryant, "Network analysis approach to multi-dimensional modeling of transistors including thermal effects," IEEE Trans. on CAD of ICs and Systems, 1, 2, pp. 94-101, 1982.
4. A. Maxim, D. Andreu, and J. Boucher, "High performance power MOSFET SPICE macromeodel," Proc. IEEE ISIE, pp. 189-194, 1997.
5. V. d'Alessandro, F. Frisina, and N. Rinaldi, "SPICE simulation of electrothermal effects in new-generation multicellular VDMOS transistors," Proc. IEEE MIEL, 1, pp. 201-204, 2002.
6. ADS user's manual, Agilent, 2004.
7. N. Rinaldi, "Thermal analysis of solid-state devices and circuits: an analytical approach," Solid-State Electronics, 44, 1789-1798, 2000.
8. N. Rinaldi, "On the modeling of the transient thermal behavior of semiconductor devices," IEEE Trans. on Electron Devices, 48, 12, pp. 2796-2802, 2001.
9. J. C. J. Paasschens, W. J. Kloosterman, and R. van der Toom, "Mextram (level 504). The Philips model for bipolar transistors," FSA modeling workshop, 2002. Available: http://www.semiconductors. philips.com/Philips_Model/bipolar/mextram.
10. N. Nenadović, V. d'Alessandro, L. La Spina, N. Rinaldi, and L. K. Nanver, "Restabilizing mechanisms after the onset of thermal instability in bipolar transistors," IEEE Trans. Electron Devices (in press).
11. V. d'Alessandro and N. Rinaldi, "A critical review of thermal models for electro-thermal simulation," Solid-State Electronics, 46, 4, pp. 487-496, 2002.
12. ATLAS user's manual, Silvaco International, 2002.
13. O. Breglio and P. Spirito, "Experimental detection of time dependent temperature maps in power bipolar transistors," Microelectronics Journal, 31, pp. 735-739, 2000.