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Volumn 31, Issue 9, 2000, Pages 735-739

Experimental detection of time dependent temperature maps in power bipolar transistors

Author keywords

[No Author keywords available]

Indexed keywords

RADIOMETRY; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT; THERMODYNAMIC STABILITY;

EID: 0034299456     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(00)00052-5     Document Type: Article
Times cited : (15)

References (8)
  • 4
    • 0342652927 scopus 로고    scopus 로고
    • Estimation of the IGBT silicon temperature during short-circuit condition in order to detect the failure mode
    • Calmon F., Chante J.-P., Sénès A., Reymond B. Estimation of the IGBT silicon temperature during short-circuit condition in order to detect the failure mode. EPE Journal. 6:(2):1996;25-32.
    • (1996) EPE Journal , vol.6 , Issue.2 , pp. 25-32
    • Calmon, F.1    Chante, J.-P.2    Sénès, A.3    Reymond, B.4
  • 6
    • 0028391997 scopus 로고
    • Heterodyn interferometer for the detection of electric and thermal signals in integrated circuits through the substrate
    • Goldestein M., Solkner G., Gornik E. Heterodyn interferometer for the detection of electric and thermal signals in integrated circuits through the substrate. Microelectronic Engineering. 24:1994;431-436.
    • (1994) Microelectronic Engineering , vol.24 , pp. 431-436
    • Goldestein, M.1    Solkner, G.2    Gornik, E.3
  • 7
    • 85031574839 scopus 로고    scopus 로고
    • Commercial Catalogue of Thermal Video System™ from Nippon Avionics corporation
    • Commercial Catalogue of Thermal Video System™ from Nippon Avionics corporation.
  • 8
    • 85031561136 scopus 로고    scopus 로고
    • Commercial Catalogue of Infrascope™ from EDO corporation
    • Commercial Catalogue of Infrascope™ from EDO corporation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.