Structure and electrical properties of Pb(Zr0.25Ti 0.75)O3 thin films on LaNiO3-Coated thermally oxidized Si substrates

Journal of Sol-Gel Science and Technology

Volumn 42, Issue 3, 2007, Pages 353-356

  Bao, Dinghua ^a   Ruan, Kaibin ^a   Liang, Tong ^a  

^a SUN YAT SEN UNIVERSITY   (China)

Author keywords

Chemical solution deposition; Ferroelectric; Oxide electrode; Thin film

Indexed keywords

DEPOSITION; ELECTRIC PROPERTIES; HEAT TREATMENT; LEAD COMPOUNDS; OXIDANTS;

CHEMICAL SOLUTION DEPOSITION (CSD); OXIDE ELECTRODES; PLANTIUM-COATED SILICON SUBSTRATES;

THIN FILMS;

EID: 34247391500     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-007-0743-7     Document Type: Article

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