Chemical solution processing and characterization of Ba(Zr,Ti)O 3/LaNiO3 layered thin films

Journal of Sol-Gel Science and Technology

Volumn 42, Issue 3, 2007, Pages 213-220

  Sakamoto, Wataru ^a   Mimura, Ken Ichi ^a   Naka, Takafumi ^a   Shimura, Tetsuo ^a   Yogo, Toshinobu ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Ba(Zr,Ti)O3; Chemical solution deposition; Electrical properties; LaNiO3; Layered thin film

Indexed keywords

BARIUM COMPOUNDS; CRYSTALLIZATION; DIELECTRIC LOSSES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY;

CHEMICAL SOLUTION DEPOSITION; LAYERED THIN FILMS; PEROVSKITE SINGLE PHASE; TEMPERATURE DEPENDENCE;

THIN FILMS;

EID: 34247370601     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-006-0652-1     Document Type: Article

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