Advanced X-ray methods for chalcogenide thin film analysis

Thin Solid Films

Volumn 515, Issue 15 SPEC. ISS., 2007, Pages 5992-5996

  Kotschau I M ^a   Weber, A ^a   Pistor, P ^a   Lauermann, I ^a   Fischer, Ch H ^a   Schock, H W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Depth profiling; In situ EDXRD; Thin films; XES; XRD

Indexed keywords

CHALCOGENIDES; CRYSTAL GROWTH; DEPTH PROFILING; X RAY DIFFRACTION ANALYSIS;

CHALCOPYRITES; GRAZING INCIDENCE X-RAY DIFFRACTION (GIXRD); SOFT X-RAY EMISSION SPECTROSCOPY (S-XES);

THIN FILMS;

EID: 34247328514     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.158     Document Type: Article

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