Suitability of lithium doped electron injection layers for organic semiconductor lasers

Applied Physics Letters

Volumn 90, Issue 15, 2007, Pages

  Rabe, T ^a   Hamwi, S ^a   Meyer, J ^a   Gorrn P ^a   Riedl, T ^a   Johannes, H H ^a   Kowalsky, W ^a  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTRONS; OPTICAL LOSSES; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR DOPING; WAVEGUIDES;

LITHIUM DOPED ELECTRON INJECTION LAYERS; ORGANIC LASER DIODES; ORGANIC SEMICONDUCTOR LASERS; WAVEGUIDE LOSSES;

INJECTION LASERS;

EID: 34247264335     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2720757     Document Type: Article

References (22)

1. M. Reufer, S. Riechel, J. M. Lupton, J. Feldmann, U. Lemmer, D. Schneider, T. Benstem, T. Dobbeitin, W. Kowalsky, A. Gombert, K. Forberich, V. Wittwer, and U. Scherf, Appl. Phys. Lett. 84, 3262 (2004).
2. H. Nakatonani, T. Oyamada, Y. Kawamura, H. Sasabe, and C. Adachi, Jpn. J. Appl. Phys., Part 1 44, 3659 (2005).
3. M. A. Saldo, R. J. Holmes, and S. R. Forrest, Phys. Rev. B 66, 035321 (2002).
4. D. Schneider, T. Rabe, T. Riedl, T. Dobbertin, M. Kröger, E. Becker, H.-H. Johannes, W. Kowalsky, T. Weimann, J. Wang, and P. Hinze, Appl. Phys. Lett. 85, 1659 (2004).
5. M. Ichikawa, Y. Tanaka, N. Suganuma, T. Koyama, and Y. Taniguchi, Jpn. J. Appl. Phys., Part 1 42, 5590 (2003).
6. W. Kowalsky, T. Rabe, D. Schneider, H. H. Johannes, C. Karnutsch, M. Gerken, U. Lemmer, J. Wang, T. Weimann, P. Hinze, and T. Riedl, Proc. SPIE 6008, 194 (2005).
7. T. Matsushima, H. Sasabe, and C. Adachi, Appl. Phys. Lett. 88, 033508 (2006).
8. P. Andrew, G. A. Turnbull, I. D. W. Samuel, and W. L. Barnes, Appl. Phys. Lett. 81, 954 (2002).
9. H. Yamamoto, T. Oyamada, H. Sasabe, and C. Adachi, Appl. Phys. Lett. 84, 1401 (2004).
10. P. Görm, T. Rabe, T. Riedl, W. Kowalsky, F. Galbrecht, and U. Scherf. Appl. Phys. Lett. 89, 161113 (2006).
11. H. Kim, C. M. Gilmore, J. S. Horwitz, A. Piqué, H. Murata, G. P. Kushto, R. Schlaf, Z. H. Kafafi, and D. B. Chrisey, Appl. Phys. Lett. 76, 259 (2000).
12. K. L. Shaklee, R. E. Nahory, and R. F. Leheny, J. Lumin. 7, 284 (1973).
13. M. Berggren, A. Dodabalapur, R. E. Slusher, and Z. Bao, Nature (London) 389, 466 (1997).
14. G. Heliotis, D. D. C. Bradley, G. A. Tumbull, and I. D. W. Samuel, Appl. Phys. Lett. 81, 415 (2002).
15. I. D. Parker, J. Appl. Phys. 75, 1656 (1994).
16. W. T. Kelvin, Philos. Mag. 46, 82 (1898).
17. W. A. Zisman, Rev. Sci. Instrum. 47, 840 (1932).
18. T. Minami, J. Vac. Sci. Technol. A 17, 1765 (1999).
19. P. A. Anderson, Phys. Rev. 75, 1205 (1949).
20. T. Dobbertin, O. Werner, J. Meyer, A. Kammoun, D. Schneider, T. Riedl, E. Becker, H.-H. Johannes, and W. Kowalsky, Appl. Phys. Lett. 83, 5071 (2003).
21. G. Parthasarathi, C. Shen, A. Kahn, and S. R. Forrest, J. Appl. Phys. 89, 4986 (2001).
22. E. I. Haskal, A. Curioni, P. F. Seidler, and W. Andreoni, Appl. Phys. Lett. 71, 1151 (1997).