Laser threshold reduction in an all-spiro guest-host system

Applied Physics Letters

Volumn 85, Issue 10, 2004, Pages 1659-1661

  Schneider, D ^a   Rabe, T ^a   Riedl, T ^a   Dobbertin, T ^a   Kroger M ^a   Becker, E ^a   Johannes, H H ^a   Kowalsky, W ^a   Weimann, T ^b   Wang, J ^b   Hinze, P ^b  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ENERGY TRANSFER; GLASS TRANSITION; LIGHT EMITTING DIODES; ORGANIC CONDUCTORS; REFRACTIVE INDEX; SEMICONDUCTOR DOPING; SILICON WAFERS; SPONTANEOUS EMISSION; THIN FILMS;

ALL-SPIRO GUEST-HOST (G-H) SYSTEMS; AMPLIFIED SPONTANEOUS EMISSION (ASE); BRAGG REFLECTORS; ORGANIC LIGHT EMITTING DIODES (OLED);

DISTRIBUTED FEEDBACK LASERS;

EID: 4944250669     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1792794     Document Type: Article

References (13)

1. V. Kozlov, V. Buloviç, P. Burrows, and S. Forrest, Nature (London) 389, 362 (1997).
2. M. Berggren, A. Dodabalapur, R. E. Slusher, and Z. Bao, Nature (London) 389, 466 (1997).
3. V. Buloviç, V. G. Kozlov, V. B. Khalfin, and S. R. Forrest, Science 279, 553 (1998).
4. D. Schneider, T. Rabe, T. Riedl, T. Dobbertin, O. Werner, M. Kröger, E. Becker, H.-H. Johannes, W. Kowalsky, T. Weimann, J. Wang, P. Hinze, A. Gerhard, P. Stössel, and H. Vestweber, Appl. Phys. Lett. 84, 4693 (2004).
5. J. Salbeck and F. Weissörtel, Macromol. Symp. 125, 121 (1997).
6. H. Spreitzer, H. Schenk, J. Salbeck, F. Weissoertel, H. Riel, and W. Riess, Proc. SPIE 3797, 316 (1999).
7. V. G. Kozlov, V. Bulovic, P. E. Burrows, M. Baldo, V. B. Khalfin, G. Parthasarathy, S. R. Forrest, Y. You, and M. E. Thompson, J. Appl. Phys. 84, 4096 (1998).
8. D. Schneider, S. Hartmann, T. Benstem, T. Dobbertin, D. Heithecker, D. Metzdorf, E. Becker, T. Riedl, H.-H. Johannes, W. Kowalsky, T. Weimann, J. Wang, and P. Hinze, Appl. Phys. B: Lasers Opt. 77, 399 (2003).
9. N. Johansson, J. Salbeck, J. Bauer, F. Weissörtel, P. Bröms, A. Andersson, and W. R. Salaneck, Adv. Mater. (Weinheim, Ger.) 10, 1136 (1998).
10. J. Salbeck, M. Schörner, and T. Fuhrmann, Thin Solid Films 417, 20 (2002).
11. v. Buloviç, R. Deshpande, M. E. Thompson, and S. R. Forrest, Chem. Phys. Lett. 308, 317 (1999).
12. G. Kranzelbinder, E. Toussaere, J. Zyss, T. Kavc, G. Langer, and W. Kern, Appl. Phys. Lett. 82, 2203 (2003).
13. M. Ichikawa, Y. Tanaka, N. Suganuma, T. Koyama, and Y. Taniguchi, Jpn. J. Appl. Phys., Part 1 42, 5590 (2003).