HREM and STEM of intergranular films at zinc oxide varistor grain boundaries

Journal of Microscopy

Volumn 191, Issue 3, 1998, Pages 275-285

  Chiang, Y M ^a   Wang, H ^a   Lee, J R ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Grain boundaries; HREM; STEM

Indexed keywords

AMORPHOUS FILMS; BISMUTH COMPOUNDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; VARISTORS; ZINC OXIDE;

APPLIED PRESSURE; GRAIN BOUNDARY SEGREGATION; GRAIN-BOUNDARIES; INTERGRANULAR AMORPHOUS FILMS; INTERGRANULAR FILMS; MULTICOMPONENTS; PRESSURE AND TEMPERATURE; SCAN METHODS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE VARISTORS;

GRAIN BOUNDARIES;

ANALYTIC METHOD; ARTICLE; ELECTRON MICROSCOPY; FILM; GRAIN; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS;

EID: 0031713141     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.00377.x     Document Type: Article

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