Temperature treatment of semiconducting polymers: An X-ray reflectivity study

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5601-5605

  Werzer, Oliver ^a   Matoy, Kurt ^a   Strohriegl, Peter ^b   Resel, Roland ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

F8T2; P3HT; Poly aryl amine; Temperature study; X ray reflectivity

Indexed keywords

CRYSTALLINE MATERIALS; HEAT TREATMENT; POLYMER FILMS; SILICON WAFERS; THIN FILM TRANSISTORS; X RAY DIFFRACTION;

POLY ARYL AMINES; POLYMER THIN FILMS; TEMPERATURE TREATMENT; X-RAY REFLECTIVITY;

SEMICONDUCTING POLYMERS;

EID: 34247130926     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.005     Document Type: Article

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