Effects of deposition temperature and thickness on the structural properties of thermal evaporated bismuth thin films

Applied Surface Science

Volumn 253, Issue 14, 2007, Pages 5931-5938

  Kumari, Latha ^a   Lin, Shih Jie ^a   Lin, Jin Han ^a   Ma, Yuan Ron ^a   Lee, Ping Chung ^b   Liou, Yung ^b  

^a NATIONAL DONG HWA UNIVERSITY   (Taiwan)

^b INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

Atomic force microscopy; Bismuth thin film; Evaporation; Scanning electron microscopy; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; THERMAL EVAPORATION; X RAY DIFFRACTION;

BISMUTH THIN FILM; CRYSTALLINE ORIENTATION; DEPOSITION TEMPERATURE; RHOMBOHEDRAL PHASE;

THIN FILMS;

EID: 34247128680     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.12.125     Document Type: Article

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